The polyimide film and insulation barrier of Broadcom gate drive optocouplers proves robust even during catastrophic failures like the IGBT destructive tests presented in this paper. Although the gate driver boards were damaged, the gate drive optocouplers were able to pass partial discharge and high voltage tests, providing reinforced insulation, protecting the systems and users. This paper discusses the impact of unprotected IGBT destructive tests on the insulation barrier of a Broadcom gate drive optocoupler.

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